Taylor Hobson has released its new CCI MP-L, based on modern CCI interferometry technology. With 1024 x 1024 pixel array, it can provide nanometre resolution and a large FOV. Powerful software analysis tools help researchers and developers keep pace with the latest developments whist also enabling high speed and high quality process control. It utilizes closed loop piezoless Z axis scanner to provide unbeatable flatness and form measurement. Proven correlation with stylus instruments provides reassurance to those wishing to upgrade from contact metrology.
CCI MP-L also offers the upgradability to CCI MP Functionality.
Key powerful performance
- Industry leading data quality
- Robust design ensures low cost of ownership
- 64-bit control and analysis software
- Upgradability to CCI MP
CCI MP-L is the ideal non-contact profiler for quantitative measurements of 3D form and roughness surfaces.
CCI measurement benefits…
Corroded surfaces
Complex surfaces such as corroded samples need a modern interferometer to understand the detailed surface. The range and resolution of the CCI MP-L are critical for this type of measurement.
Rough machined surfaces
Because rough surfaces scatter light they are often difficult to measure. The unique CCI algorithm and high sensitivity camera gives less missing data points than any of our leading competitors.
Structured surface – dimples
Modern engineering surfaces have dimples in the surface to retain the lubrication fluids. CCI is ideal for measuring the spacing and dimensions of the pits
Structured surface – sealing surface
The CCI MP-L is ideal for studying structured surfaces used for sealing. The detail obtained can be used for controlling surface manufacture
The CCI MP-L is an industry-changing blend of science, experience and imagination with high quality 3D measurement.
More information click here.